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Delivery Time : 3-5 working days
Model Number : PHB08-00B1-2000-A
MOQ : 500
Current Rating : 3A
Y-Width of Bottom Edge on Board : 7.3mm
Operating Temperature : -25℃~+85℃
Contact Plating : Tin
Color : White
Number of PINs : 8P
Z-Height of the Board : 10.3mm
Number of Rows : 2
Number of PINs Per Row : 4
Row Spacing : 2mm
Description : 2x4P 2 2mm 8P -25℃~+85℃ 4 3A 250V 2mm Through Hole,P=2mm Headers, Male Pins RoHS
Flame Retardant Rating : UL94V-0
Pitch : 2mm
Voltage Rating (Max) : 250V
Pins Structure : 2x4P
Contact Material : PA6T;Copper alloy
X-Length of Bottom Edge on Board (Spacing Line) : 10mm
Brand Name : SHETIME
Mounting Type : Through Hole
Packaging Details : Through Hole,P=2mm
Stock : 50000
This section details the mechanical performance characteristics of the product, including terminal crimping strength, insertion and withdrawal forces, and pin retention force. These tests ensure the reliability and durability of the connections under various mechanical stresses.
Terminal crimping wires, axial
RequirementMore than 50N (AWG#22 wire), =50N (AWG#22 F2k), More than 30N (AWG#24 wire), Z30N (AWG#24 34), More than 20N (AWG#26 wire), Z20N (AWG#26 S8k), More than 13N (AWG#28 wire), Z13N (AWG#28 5%)
Terminal crimping wire strength
RequirementFixed terminals: More than 15N
Single contact inserting force test
RequirementLess than 6N
Single contact withdrawal force test
RequirementMore than 0.5N
Pin Retention force
RequirementMore than 15N
Contact Resistance
Requirement<30mΩ
Durability
RequirementMate connectors up to 30 cycles at a Maximum rate of 10 cycles per minute prior to environmental test.
| Item | Test Mode | Requirement |
|---|---|---|
| Terminal crimping wires, axial | Pullout force | AWG#22 wire: >50N, AWG#24 wire: >30N, AWG#26 wire: >20N, AWG#28 wire: >13N |
| Terminal crimping wire strength | Pullout force | Fixed terminals: >15N |
| Single contact | Insertion force test | <6N |
| Single contact | Withdrawal force test | >0.5N |
| Per contact | Pin Retention force | >15N |
| Contact Resistance | Durability | <30mΩ |
| Humidity | Constant temperature and humidity test | Appearance: No damage, Contact Resistance: <30mΩ, Insulation Resistance: =500MΩ, Withstand Voltage: No breakdown or flashover |
| Temperature cycling | Thermal shock test | Appearance: No damage, Contact Resistance: <30mΩ, Insulation Resistance: =500MΩ, Withstand Voltage: No breakdown or flashover |
| Vibration | Resistance to vibration test | Appearance: No damage, Contact Resistance: <30mΩ, Current Discontinuity: 1 micro second Max |
| Thermal Aging | High temperature aging test | Appearance: No damage, Contact Resistance: <30mΩ |
| Item | Test Mode | Requirement |
|---|---|---|
| Temperature rise | Maximum rated current | Measure temperature rise of contact when maximum rated current is passed. |
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SHETIME PHB08-00B1-2000-A Images |